Assignee
ADLER DAVID L
US·8 granted patents·1 pending application·121 citations·filing 2006–2022
Top patents by PatentIndex Score
9 records- 0197US9291578B2X-ray photoemission microscope for integrated devicesADLER DAVID L·Filed 2012·Granted Mar 22, 2016·33 cites·38 claims
- 0297US8995622B2X-ray source with increased operating lifeADLER DAVID L·Filed 2011·Granted Mar 31, 2015·35 cites·21 claims
- 0397US8831179B2X-ray source with selective beam repositioningADLER DAVID L·Filed 2011·Granted Sep 9, 2014·41 cites·18 claims
- 0484US8729470B2Electron microscope with an emitter operating in medium vacuumADLER DAVID L·Filed 2009·Granted May 20, 2014·7 cites·20 claims
- 0583US11307152B2X-ray photoemission apparatus for inspection of integrated devicesADLER DAVID L·Filed 2019·Granted Apr 19, 2022·2 cites·20 claims
- 0676US11619596B2X-ray photoemission system for 3-D laminographyADLER DAVID L·Filed 2022·Granted Apr 4, 2023·0 cites·20 claims
- 0775US9142382B2X-ray source with an immersion lensADLER DAVID L·Filed 2011·Granted Sep 22, 2015·2 cites·22 claims
- 0866US8110799B2Confocal secondary electron imagingADLER DAVID L·Filed 2007·Granted Feb 7, 2012·1 cites·20 claims
- 0947US2007145267A1Portable scanning electron microscopeADLER DAVID L·Filed 2006·Application pending·0 cites
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