Assignee
ADVANTEST AMERICA INC
US·5 granted patents·6 citations·filing 2010–2017
Top patents by PatentIndex Score
5 records- 0174US8344748B2Probe for testing semiconductor devicesADVANTEST AMERICA INC·Filed 2010·Granted Jan 1, 2013·4 cites·36 claims
- 0259US10564184B2Methods to manufacture semiconductor probe tipsADVANTEST AMERICA INC·Filed 2017·Granted Feb 18, 2020·0 cites·10 claims
- 0358US9194887B2Fine pitch probes for semiconductor testing, and a method to fabricate and assemble sameADVANTEST AMERICA INC·Filed 2013·Granted Nov 24, 2015·1 cites·19 claims
- 0455US9000793B2Fine pitch probes for semiconductor testing, and a method to fabricate and assemble sameADVANTEST AMERICA INC·Filed 2013·Granted Apr 7, 2015·1 cites·20 claims
- 0554US9678108B1Methods to manufacture semiconductor probe tipsADVANTEST AMERICA INC·Filed 2014·Granted Jun 13, 2017·0 cites·8 claims
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