Assignee
ADVANTEST CORP
JP1,865 patents
Top patents by PatentIndex Score
US6678645B1Jan 13, 2004
Method and apparatus for SoC design validation
ADVANTEST CORP276 citations99
US6249893B1Jun 19, 2001
Method and structure for testing embedded cores based system-on-a-chip
ADVANTEST CORP199 citations99
US6208161B1Mar 27, 2001
Differential signal transmission circuit
ADVANTEST CORP262 citations99
US6031282AFeb 29, 2000
High performance integrated circuit chip package
ADVANTEST CORP187 citations99
US5767690AJun 16, 1998
Test head cooling system
ADVANTEST CORP104 citations99
US5113139AMay 12, 1992
Low-distortion waveform generating method and waveform generator using the same
ADVANTEST CORP162 citations99
US6917102B2Jul 12, 2005
Contact structure and production method thereof and probe contact assembly using same
ADVANTEST CORP71 citations98
US6795496B1Sep 21, 2004
Jitter measuring device and method
ADVANTEST CORP117 citations98
US6677245B2Jan 13, 2004
Contact structure production method
ADVANTEST CORP100 citations98
US6676438B2Jan 13, 2004
Contact structure and production method thereof and probe contact assembly using same
ADVANTEST CORP92 citations98
US6586956B2Jul 1, 2003
Probe contract system having planarity adjustment mechanism
ADVANTEST CORP75 citations98
US6445203B1Sep 3, 2002
Electric device testing apparatus
ADVANTEST CORP103 citations98
US6331770B1Dec 18, 2001
Application specific event based semiconductor test system
ADVANTEST CORP90 citations98
US6255727B1Jul 3, 2001
Contact structure formed by microfabrication process
ADVANTEST CORP84 citations98
US6250933B1Jun 26, 2001
Contact structure and production method thereof
ADVANTEST CORP209 citations98
US6184576B1Feb 6, 2001
Packaging and interconnection of contact structure
ADVANTEST CORP121 citations98
US6052284AApr 18, 2000
Printed circuit board with electronic devices mounted thereon
ADVANTEST CORP166 citations98
US6487700B1Nov 26, 2002
Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using it
ADVANTEST CORP89 citations97
US6408105B1Jun 18, 2002
Method for detecting slope of image data utilizing hough-transform
ADVANTEST CORP84 citations97
US6354792B1Mar 12, 2002
IC receiving tray storage device and mounting apparatus for the same
ADVANTEST CORP102 citations97
US6339321B1Jan 15, 2002
Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus
ADVANTEST CORP85 citations97
US6218203B1Apr 17, 2001
Method of producing a contact structure
ADVANTEST CORP120 citations97
US6174744B1Jan 16, 2001
Method of producing micro contact structure and contact probe using same
ADVANTEST CORP248 citations97
US6066822AMay 23, 2000
Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
ADVANTEST CORP94 citations97
US5865319AFeb 2, 1999
Automatic test handler system for IC tester
ADVANTEST CORP146 citations97
US5172049ADec 15, 1992
IC test equipment
ADVANTEST CORP175 citations97
US6975978B1Dec 13, 2005
Method and apparatus for fault simulation of semiconductor integrated circuit
ADVANTEST CORP64 citations96
US6903353B2Jun 7, 2005
Charged particle beam exposure apparatus, device manufacturing method, and charged particle beam applied apparatus
ADVANTEST CORP57 citations96
US6762612B2Jul 13, 2004
Probe contact system having planarity adjustment mechanism
ADVANTEST CORP62 citations96
US6736665B2May 18, 2004
Contact structure production method
ADVANTEST CORP66 citations96
US6687868B1Feb 3, 2004
Test device and method for electrically testing electronic device
ADVANTEST CORP60 citations96
US6678643B1Jan 13, 2004
Event based semiconductor test system
ADVANTEST CORP55 citations96
US6651204B1Nov 18, 2003
Modular architecture for memory testing on event based test system
ADVANTEST CORP64 citations96
US6629282B1Sep 30, 2003
Module based flexible semiconductor test system
ADVANTEST CORP59 citations96
US6621860B1Sep 16, 2003
Apparatus for and method of measuring a jitter
ADVANTEST CORP44 citations96
US6576485B2Jun 10, 2003
Contact structure and production method thereof and probe contact assembly using same
ADVANTEST CORP74 citations96
US6536006B1Mar 18, 2003
Event tester architecture for mixed signal testing
ADVANTEST CORP58 citations96
US6532561B1Mar 11, 2003
Event based semiconductor test system
ADVANTEST CORP62 citations96
US6440775B2Aug 27, 2002
Method and apparatus for edge connection between elements of an integrated circuit
ADVANTEST CORP67 citations96
US6436802B1Aug 20, 2002
Method of producing contact structure
ADVANTEST CORP66 citations96
US6420884B1Jul 16, 2002
Contact structure formed by photolithography process
ADVANTEST CORP73 citations96
US6408412B1Jun 18, 2002
Method and structure for testing embedded analog/mixed-signal cores in system-on-a-chip
ADVANTEST CORP56 citations96
US6399900B1Jun 4, 2002
Contact structure formed over a groove
ADVANTEST CORP44 citations96
US6351133B1Feb 26, 2002
Packaging and interconnection of contact structure
ADVANTEST CORP48 citations96
US6313653B1Nov 6, 2001
IC chip tester with heating element for preventing condensation
ADVANTEST CORP56 citations96
US6263463B1Jul 17, 2001
Timing adjustment circuit for semiconductor test system
ADVANTEST CORP71 citations96
US6257771B1Jul 10, 2001
Opitcal/electrical hybrid wiring board and its manufacturing method
ADVANTEST CORP78 citations96
US6232669B1May 15, 2001
Contact structure having silicon finger contactors and total stack-up structure using same
ADVANTEST CORP70 citations96
US6157200ADec 5, 2000
Integrated circuit device tester
ADVANTEST CORP83 citations96
US6104183AAug 15, 2000
Semiconductor device testing apparatus
ADVANTEST CORP62 citations96
Showing the top 50 of 1,865 patents by PatentIndex Score.