Assignee
ADVANTEST CORP
JP·1,865 granted patents·332 pending applications·27,706 citations·filing 1985–2025
Top patents by PatentIndex Score
2,197 records- 0199US6250933B1Contact structure and production method thereofADVANTEST CORP·Filed 2000·Granted Jun 26, 2001·209 cites·17 claims
- 0298US11143697B2Automated handling of different form factor devices under test in test cellADVANTEST CORP·Filed 2017·Granted Oct 12, 2021·33 cites·27 claims
- 0397US6795496B1Jitter measuring device and methodADVANTEST CORP·Filed 2000·Granted Sep 21, 2004·117 cites·19 claims
- 0497US6249893B1Method and structure for testing embedded cores based system-on-a-chipADVANTEST CORP·Filed 1998·Granted Jun 19, 2001·199 cites·17 claims
- 0597US6208161B1Differential signal transmission circuitADVANTEST CORP·Filed 1998·Granted Mar 27, 2001·262 cites·11 claims
- 0697US6174744B1Method of producing micro contact structure and contact probe using sameADVANTEST CORP·Filed 2000·Granted Jan 16, 2001·248 cites·12 claims
- 0796US10288681B2Test architecture with a small form factor test board for rapid prototypingADVANTEST CORP·Filed 2018·Granted May 14, 2019·11 cites·27 claims
- 0896US6677245B2Contact structure production methodADVANTEST CORP·Filed 2002·Granted Jan 13, 2004·100 cites·20 claims
- 0996US6586956B2Probe contract system having planarity adjustment mechanismADVANTEST CORP·Filed 2001·Granted Jul 1, 2003·75 cites·29 claims
- 1096US6331770B1Application specific event based semiconductor test systemADVANTEST CORP·Filed 2000·Granted Dec 18, 2001·90 cites·12 claims
- 1195US11579187B1Test carrier and electronic component testing apparatusADVANTEST CORP·Filed 2022·Granted Feb 14, 2023·2 cites·16 claims
- 1295US11009550B2Test architecture with an FPGA based test board to simulate a DUT or end-pointADVANTEST CORP·Filed 2018·Granted May 18, 2021·9 cites·20 claims
- 1395US8988095B2Socket and electronic device test apparatusADVANTEST CORP·Filed 2012·Granted Mar 24, 2015·18 cites·5 claims
- 1495US7809520B2Test equipment, method for loading test plan and program productADVANTEST CORP·Filed 2007·Granted Oct 5, 2010·36 cites·14 claims
- 1595US6676438B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2001·Granted Jan 13, 2004·92 cites·20 claims
- 1695US6678645B1Method and apparatus for SoC design validationADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·276 cites·33 claims
- 1795US6576485B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2002·Granted Jun 10, 2003·74 cites·15 claims
- 1895US6487700B1Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using itADVANTEST CORP·Filed 2000·Granted Nov 26, 2002·89 cites·9 claims
- 1995US6031282AHigh performance integrated circuit chip packageADVANTEST CORP·Filed 1998·Granted Feb 29, 2000·187 cites·14 claims
- 2095US5865319AAutomatic test handler system for IC testerADVANTEST CORP·Filed 1996·Granted Feb 2, 1999·146 cites·23 claims
- 2195US5172049AIC test equipmentADVANTEST CORP·Filed 1991·Granted Dec 15, 1992·175 cites·5 claims
- 2295US5113139ALow-distortion waveform generating method and waveform generator using the sameADVANTEST CORP·Filed 1991·Granted May 12, 1992·162 cites·4 claims
- 2394US11430536B2Software-focused solution for arbitrary all-data odd sector size supportADVANTEST CORP·Filed 2021·Granted Aug 30, 2022·5 cites·19 claims
- 2494US10884847B1Fast parallel CRC determination to support SSD testingADVANTEST CORP·Filed 2019·Granted Jan 5, 2021·14 cites·20 claims
- 2594US10114067B2Integrated waveguide structure and socket structure for millimeter waveband testingADVANTEST CORP·Filed 2016·Granted Oct 30, 2018·20 cites·24 claims
- 2694US7679391B2Test equipment and semiconductor deviceADVANTEST CORP·Filed 2008·Granted Mar 16, 2010·27 cites·17 claims
- 2794US7509517B2Clock transferring apparatus for synchronizing input data with internal clock and test apparatus having the sameADVANTEST CORP·Filed 2006·Granted Mar 24, 2009·37 cites·7 claims
- 2894US7132844B2Testing device and testing method for testing an electronic deviceADVANTEST CORP·Filed 2005·Granted Nov 7, 2006·28 cites·16 claims
- 2994US7020360B2Wavelength dispersion probing systemADVANTEST CORP·Filed 2002·Granted Mar 28, 2006·113 cites·11 claims
- 3094US6975978B1Method and apparatus for fault simulation of semiconductor integrated circuitADVANTEST CORP·Filed 2000·Granted Dec 13, 2005·64 cites·9 claims
- 3194US6787780B2Multi-beam exposure apparatus using a multi-axis electron lens, fabrication method of a semiconductor deviceADVANTEST CORP·Filed 2001·Granted Sep 7, 2004·51 cites·21 claims
- 3294US6736665B2Contact structure production methodADVANTEST CORP·Filed 2002·Granted May 18, 2004·66 cites·10 claims
- 3394US6464511B1IC socket and IC testerADVANTEST CORP·Filed 1999·Granted Oct 15, 2002·139 cites·5 claims
- 3494US5440260AVariable delay circuitADVANTEST CORP·Filed 1994·Granted Aug 8, 1995·117 cites·2 claims
- 3593US7978109B1Output apparatus and test apparatusADVANTEST CORP·Filed 2010·Granted Jul 12, 2011·20 cites·14 claims
- 3693US7340364B1Test apparatus, and control methodADVANTEST CORP·Filed 2006·Granted Mar 4, 2008·37 cites·7 claims
- 3793US6917102B2Contact structure and production method thereof and probe contact assembly using sameADVANTEST CORP·Filed 2003·Granted Jul 12, 2005·71 cites·20 claims
- 3893US6687868B1Test device and method for electrically testing electronic deviceADVANTEST CORP·Filed 2000·Granted Feb 3, 2004·60 cites·26 claims
- 3993US6651204B1Modular architecture for memory testing on event based test systemADVANTEST CORP·Filed 2000·Granted Nov 18, 2003·64 cites·13 claims
- 4093US6436802B1Method of producing contact structureADVANTEST CORP·Filed 2000·Granted Aug 20, 2002·66 cites·36 claims
- 4193US6066822ASemiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted May 23, 2000·94 cites·7 claims
- 4293US6052284APrinted circuit board with electronic devices mounted thereonADVANTEST CORP·Filed 1997·Granted Apr 18, 2000·166 cites·31 claims
- 4393US5767690ATest head cooling systemADVANTEST CORP·Filed 1997·Granted Jun 16, 1998·104 cites·1 claims
- 4493US5313156AApparatus for automatic handlingADVANTEST CORP·Filed 1991·Granted May 17, 1994·179 cites·24 claims
- 4593US4602220AVariable frequency synthesizer with reduced phase noiseADVANTEST CORP·Filed 1985·Granted Jul 22, 1986·155 cites·20 claims
- 4692US11313850B2Small particle measurement systemADVANTEST CORP·Filed 2019·Granted Apr 26, 2022·3 cites·6 claims
- 4792US11181576B2Electronic component handling apparatus and electronic component testing apparatusADVANTEST CORP·Filed 2020·Granted Nov 23, 2021·5 cites·10 claims
- 4892US10161993B2Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA blockADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·18 cites·25 claims
- 4992US10162007B2Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independentlyADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·13 cites·32 claims
- 5092US9291667B2Adaptive thermal controlADVANTEST CORP·Filed 2014·Granted Mar 22, 2016·45 cites·24 claims
Showing the top 50 of 2,197 patent records by PatentIndex Score.
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