Assignee
AGEMURA TOSHIHIDE
JP·2 granted patents·1 pending application·6 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0181US8304723B2Defect inspection and charged particle beam apparatusAGEMURA TOSHIHIDE·Filed 2010·Granted Nov 6, 2012·4 cites·7 claims
- 0267US8455820B2Composite charged particle beams apparatusAGEMURA TOSHIHIDE·Filed 2010·Granted Jun 4, 2013·2 cites·37 claims
- 0341US2014175279A1Charged particle beam apparatusAGEMURA TOSHIHIDE·Filed 2012·Application pending·0 cites
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