Assignee
AKASHI SEISAKUSHO KK
JP·13 granted patents·221 citations·filing 1974–1982
Top patents by PatentIndex Score
13 records- 0189US4420686AScanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimenAKASHI SEISAKUSHO KK·Filed 1981·Granted Dec 13, 1983·52 cites·7 claims
- 0289US4209702AMultiple electron lensAKASHI SEISAKUSHO KK·Filed 1978·Granted Jun 24, 1980·40 cites·2 claims
- 0377US4460827AScanning electron microscope or similar equipment with tiltable microscope columnAKASHI SEISAKUSHO KK·Filed 1982·Granted Jul 17, 1984·22 cites·8 claims
- 0464US4437009AScanning electron microscope or similar equipmentAKASHI SEISAKUSHO KK·Filed 1982·Granted Mar 13, 1984·13 cites·6 claims
- 0556US4118975ALoading shaft positioning apparatus for hardness testerAKASHI SEISAKUSHO KK·Filed 1977·Granted Oct 10, 1978·15 cites·4 claims
- 0653US4403511AHydraulic vibration testerAKASHI SEISAKUSHO KK·Filed 1981·Granted Sep 13, 1983·18 cites·8 claims
- 0751US4126069AMicrotomeAKASHI SEISAKUSHO KK·Filed 1977·Granted Nov 21, 1978·16 cites·3 claims
- 0850US4019376AHardness testerAKASHI SEISAKUSHO KK·Filed 1975·Granted Apr 26, 1977·12 cites·5 claims
- 0950US3949600ALoad application mechanism of Rockwell hardness testerAKASHI SEISAKUSHO KK·Filed 1974·Granted Apr 13, 1976·11 cites·3 claims
- 1047US4321468AMethod and apparatus for correcting astigmatism in scanning electron microscopes and similar equipmentAKASHI SEISAKUSHO KK·Filed 1980·Granted Mar 23, 1982·5 cites·9 claims
- 1147US4010548AShock-absorbing mechanism for dial gageAKASHI SEISAKUSHO KK·Filed 1976·Granted Mar 8, 1977·8 cites·1 claims
- 1244US3939353AElectron microscope specimen mounting apparatusAKASHI SEISAKUSHO KK·Filed 1975·Granted Feb 17, 1976·5 cites·7 claims
- 1330US4136555AReference-load variable hardness testerAKASHI SEISAKUSHO KK·Filed 1977·Granted Jan 30, 1979·4 cites·1 claims
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