Assignee
AKASHI YUKIO
JP·3 granted patents·9 citations·filing 2008–2009
Top patents by PatentIndex Score
3 records- 0176US8462990B2Infrared-ray thermal image analyzerAKASHI YUKIO·Filed 2008·Granted Jun 11, 2013·9 cites·7 claims
- 0251US8725430B2Method and apparatus for determining structural damage depth, and method and apparatus for determining structural damage treatmentAKASHI YUKIO·Filed 2009·Granted May 13, 2014·0 cites·4 claims
- 0350US8496373B2Method of infrared inspection for structure, test specimen for infrared inspection and heat conductive memberAKASHI YUKIO·Filed 2009·Granted Jul 30, 2013·0 cites·9 claims
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