Assignee
AMAGO HIROHISA
JP·1 granted patent·1 pending application·2 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0158US8404498B2Method of inspecting semiconductor thin film by transmission imaging and inspection device for the sameAMAGO HIROHISA·Filed 2009·Granted Mar 26, 2013·2 cites·14 claims
- 0235US2012111619A1Circuit substrate and manufacturing method of circuit substrateAMAGO HIROHISA·Filed 2011·Application pending·0 cites
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