Assignee
AMBER PREC INSTR INC
US·2 granted patents·6 citations·filing 2014–2014
Top patents by PatentIndex Score
2 records- 0170US9618554B2Emission source microscopy for electromagnetic interference applicationsAMBER PREC INSTR INC·Filed 2014·Granted Apr 11, 2017·4 cites·18 claims
- 0264US9599649B2System and method for electrostatic discharge testing of devices under testAMBER PREC INSTR INC·Filed 2014·Granted Mar 21, 2017·2 cites·20 claims
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