Assignee
AMST CO LTD
KR·2 granted patents·1 pending application·64 citations·filing 2001–2008
Top patents by PatentIndex Score
3 records- 0186US6414501B2Micro cantilever style contact pin structure for wafer probingAMST CO LTD·Filed 2001·Granted Jul 2, 2002·62 cites·20 claims
- 0247US7868636B2Probe card and method for fabricating the sameAMST CO LTD·Filed 2008·Granted Jan 11, 2011·2 cites·18 claims
- 0331US2010207652A1Method for wafer test and probe card for the sameAMST CO LTD·Filed 2008·Application pending·0 cites
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