Assignee
ASML NETHERLANDS B V
NL·1 granted patent·2 pending applications·0 citations·filing 2022–2025
Top patents by PatentIndex Score
3 records- 0183US2026100324A1Charged particle assessment tool, inspection methodASML NETHERLANDS B V·Filed 2025·Application pending·0 cites
- 0281US2026100327A1Photo-electrical evolution defect inspectionASML NETHERLANDS B V·Filed 2025·Application pending·0 cites
- 0352US12597102B2Image enhancement in charged particle inspectionASML NETHERLANDS B V·Filed 2022·Granted Apr 7, 2026·0 cites·13 claims
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