Assignee
ASYLUM RESEARCH CORP
US·23 granted patents·218 citations·filing 2002–2014
Top patents by PatentIndex Score
23 records- 0196US7038443B2Linear variable differential transformers for high precision position measurementsASYLUM RESEARCH CORP·Filed 2003·Granted May 2, 2006·54 cites·5 claims
- 0292US8024963B2Material property measurements using multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2008·Granted Sep 27, 2011·11 cites·3 claims
- 0392US7937991B2Fully digitally controller for cantilever-based instrumentsASYLUM RESEARCH CORP·Filed 2007·Granted May 10, 2011·11 cites·17 claims
- 0489US7603891B2Multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2006·Granted Oct 20, 2009·10 cites·27 claims
- 0587US7262592B2Linear variable differential transformers for high precision position measurementsASYLUM RESEARCH CORP·Filed 2006·Granted Aug 28, 2007·6 cites·5 claims
- 0685US8370960B2Modular atomic force microscopeASYLUM RESEARCH CORP·Filed 2009·Granted Feb 5, 2013·14 cites·3 claims
- 0785US7685869B2NanoindenterASYLUM RESEARCH CORP·Filed 2007·Granted Mar 30, 2010·10 cites·1 claims
- 0885US7165445B2Digital control of quality factor in resonant systems including cantilever based instrumentsASYLUM RESEARCH CORP·Filed 2004·Granted Jan 23, 2007·26 cites·9 claims
- 0984US7941286B2Variable density scanningASYLUM RESEARCH CORP·Filed 2006·Granted May 10, 2011·9 cites·16 claims
- 1083US7271582B2Linear variable differential transformers for high precision position measurementsASYLUM RESEARCH CORP·Filed 2006·Granted Sep 18, 2007·5 cites·10 claims
- 1182US7434445B2Apparatus for determining cantilever parametersASYLUM RESEARCH CORP·Filed 2006·Granted Oct 14, 2008·7 cites·8 claims
- 1282US6884981B2Diffractive optical position detectorASYLUM RESEARCH CORP·Filed 2002·Granted Apr 26, 2005·22 cites·15 claims
- 1380US7372254B2Linear force detecting element formed without ferromagnetic materials which produces a resolution in a range of microns or lessASYLUM RESEARCH CORP·Filed 2006·Granted May 13, 2008·4 cites·13 claims
- 1479US7233140B2Position sensing assembly with sychronizing capabilityASYLUM RESEARCH CORP·Filed 2006·Granted Jun 19, 2007·5 cites·5 claims
- 1579US7084384B2Diffractive optical position detector in an atomic force microscope having a moveable cantileverASYLUM RESEARCH CORP·Filed 2005·Granted Aug 1, 2006·6 cites·11 claims
- 1665US9604846B2Thermal measurements using multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2014·Granted Mar 28, 2017·1 cites·26 claims
- 1764US7234342B2Fully digital controller for cantilever-based instrumentsASYLUM RESEARCH CORP·Filed 2003·Granted Jun 26, 2007·8 cites·8 claims
- 1859US7066005B2Noncontact sensitivity and compliance calibration method for cantilever-based insturmentsASYLUM RESEARCH CORP·Filed 2002·Granted Jun 27, 2006·2 cites·8 claims
- 1954US7856665B2Apparatus and method for scanning capacitance microscopy and spectroscopyASYLUM RESEARCH CORP·Filed 2007·Granted Dec 21, 2010·3 cites·20 claims
- 2049US8042383B2Digital Q control for enhanced measurement capability in cantilever-based instrumentsASYLUM RESEARCH CORP·Filed 2008·Granted Oct 25, 2011·0 cites·19 claims
- 2148US7387017B2Digital Q control for enhanced measurement capability in cantilever-based instrumentsASYLUM RESEARCH CORP·Filed 2007·Granted Jun 17, 2008·0 cites·9 claims
- 2244US7861315B2Method for microfabricating a probe with integrated handle, cantilever, tip and circuitASYLUM RESEARCH CORP·Filed 2008·Granted Dec 28, 2010·2 cites·26 claims
- 2344US7266997B2Tactile force and/or position feedback for cantilever-based force measurement instrumentsASYLUM RESEARCH CORP·Filed 2003·Granted Sep 11, 2007·2 cites·12 claims
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