Assignee
Abreezio LLC
US·6 granted patents·168 citations·filing 2015–2015
Top patents by PatentIndex Score
6 records- 0196US9564884B1Circuitry and method for measuring negative bias temperature instability (NBTI) and hot carrier injection (HCI) aging effects using edge sensitive samplingAbreezio LLC·Filed 2015·Granted Feb 7, 2017·37 cites·20 claims
- 0296US9536038B1Method and algorithm for functional critical paths selection and critical path sensors and controller insertionAbreezio LLC·Filed 2015·Granted Jan 3, 2017·52 cites·18 claims
- 0396US9529044B1Apparatuses and methods to enhance timing delay fault coverageAbreezio LLC·Filed 2015·Granted Dec 27, 2016·22 cites·20 claims
- 0495US9564883B1Circuitry and method for timing speculation via toggling functional critical pathsAbreezio LLC·Filed 2015·Granted Feb 7, 2017·39 cites·20 claims
- 0590US9536625B1Circuitry and method for critical path timing speculation in RAMsAbreezio LLC·Filed 2015·Granted Jan 3, 2017·14 cites·30 claims
- 0688US9535121B1Methods and apparatuses to enhance timing delay fault coverage with test logic that includes partitions and scan flip-flopsAbreezio LLC·Filed 2015·Granted Jan 3, 2017·4 cites·19 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →