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Assignee

BASSLER MICHAEL

US2 patents

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US8821799B2Sep 2, 2014

Method and system implementing spatially modulated excitation or emission for particle characterization with enhanced sensitivity

BASSLER MICHAEL18 citations91
US9164037B2Oct 20, 2015

Method and system for evaluation of signals received from spatially modulated excitation and emission to accurately determine particle positions and distances

BASSLER MICHAEL6 citations71