Individual holder
BICKFORD JEANNE P
US·17 granted patents·1 pending application·87 citations·filing 2007–2013
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
18 records- 0193US8543960B1Power and timing optimization for an integrated circuit by voltage modification across various ranges of temperaturesBICKFORD JEANNE P·Filed 2012·Granted Sep 24, 2013·10 cites·16 claims
- 0293US8539429B1System yield optimization using the results of integrated circuit chip performance path testingBICKFORD JEANNE P·Filed 2012·Granted Sep 17, 2013·11 cites·20 claims
- 0389US8543966B2Test path selection and test program generation for performance testing integrated circuit chipsBICKFORD JEANNE P·Filed 2011·Granted Sep 24, 2013·8 cites·24 claims
- 0483US8095907B2Reliability evaluation and system fail warning methods using on chip parametric monitorsBICKFORD JEANNE P·Filed 2007·Granted Jan 10, 2012·9 cites·10 claims
- 0582US9058034B2Integrated circuit product yield optimization using the results of performance path testingBICKFORD JEANNE P·Filed 2012·Granted Jun 16, 2015·5 cites·20 claims
- 0680US9157956B2Adaptive power control using timing canonicalsBICKFORD JEANNE P·Filed 2012·Granted Oct 13, 2015·4 cites·24 claims
- 0780US9152168B2Systems and methods for system power estimationBICKFORD JEANNE P·Filed 2012·Granted Oct 6, 2015·9 cites·14 claims
- 0878US8726201B2Method and system to predict a number of electromigration critical elementsBICKFORD JEANNE P·Filed 2010·Granted May 13, 2014·6 cites·21 claims
- 0978US8302063B2Method and system to optimize semiconductor products for power, performance, noise, and cost through use of variable power supply voltage compressionBICKFORD JEANNE P·Filed 2010·Granted Oct 30, 2012·6 cites·20 claims
- 1076US8490040B2Disposition of integrated circuits using performance sort ring oscillator and performance path testingBICKFORD JEANNE P·Filed 2011·Granted Jul 16, 2013·3 cites·29 claims
- 1175US9557378B2Method and structure for multi-core chip product test and selective voltage binning dispositionBICKFORD JEANNE P·Filed 2012·Granted Jan 31, 2017·3 cites·25 claims
- 1275US8423945B2Methods and systems to meet technology pattern density requirements of semiconductor fabrication processesBICKFORD JEANNE P·Filed 2010·Granted Apr 16, 2013·7 cites·9 claims
- 1370US8839170B2Power/performance optimization through temperature/voltage controlBICKFORD JEANNE P·Filed 2013·Granted Sep 16, 2014·2 cites·24 claims
- 1470US8578314B1Circuit design with growable capacitor arraysBICKFORD JEANNE P·Filed 2012·Granted Nov 5, 2013·3 cites·11 claims
- 1567US8504975B2Reliability evaluation and system fail warning methods using on chip parametric monitorsBICKFORD JEANNE P·Filed 2012·Granted Aug 6, 2013·1 cites·27 claims
- 1655US8132129B2Method for computing the sensitivity of a VLSI design to both random and systematic defects using a critical area analysis toolBICKFORD JEANNE P·Filed 2009·Granted Mar 6, 2012·0 cites·11 claims
- 1753US8418090B2Method for computing the sensitivity of a VLSI design to both random and systematic defects using a critical area analysis toolBICKFORD JEANNE P·Filed 2012·Granted Apr 9, 2013·0 cites·11 claims
- 1836US2014067302A1Product reliability estimationBICKFORD JEANNE P·Filed 2012·Application pending·0 cites
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