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BU HUIMING

US3 patents

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US8318565B2Nov 27, 2012

High-k dielectric gate structures resistant to oxide growth at the dielectric/silicon substrate interface and methods of manufacture thereof

BU HUIMING3 citations61
US8097520B2Jan 17, 2012

Integration of passive device structures with metal gate layers

BU HUIMING5 citations61
US8575709B2Nov 5, 2013

High-k dielectric gate structures resistant to oxide growth at the dielectric/silicon substrate interface and methods of manufacture thereof

BU HUIMING1 citations51