Assignee
BUEHLER WOLFRAM
DE·3 granted patents·11 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0179US8507854B2Particle beam microscopy system and method for operating the sameBUEHLER WOLFRAM·Filed 2010·Granted Aug 13, 2013·7 cites·24 claims
- 0259US8414016B2Internal paneling partBUEHLER WOLFRAM·Filed 2009·Granted Apr 9, 2013·4 cites·19 claims
- 0341US8536773B2Electron beam source and method of manufacturing the sameBUEHLER WOLFRAM·Filed 2011·Granted Sep 17, 2013·0 cites·22 claims
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