Assignee
BUSHNELL MICHAEL L
US·1 granted patent·1 pending application·9 citations·filing 2009–2023
Top patents by PatentIndex Score
2 records- 0169US8164345B2Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testabilityBUSHNELL MICHAEL L·Filed 2009·Granted Apr 24, 2012·9 cites·8 claims
- 0249US2024126968A1Automatic blocking of unknown signals and grading of test point sites using untestable fault estimates to improve ic testabilityBUSHNELL MICHAEL L·Filed 2023·Application pending·0 cites
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