Assignee
CAMECA
FR15 patents
Top patents by PatentIndex Score
US4564758AJan 14, 1986
Process and device for the ionic analysis of an insulating sample
CAMECA40 citations87
US4440475AApr 3, 1984
Electron probe microanalyzer comprising an observation system having double magnification
CAMECA61 citations85
US6259530B1Jul 10, 2001
Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer
CAMECA15 citations75
US4779046AOct 18, 1988
Electron beam integrated circuit tester
CAMECA23 citations72
US4748325AMay 31, 1988
Method and device to discharge samples of insulating material during ion analysis
CAMECA17 citations71
US3975675AAug 17, 1976
Impulse response magnetic resonance spectrometer
CAMECA31 citations70
US5189304AFeb 23, 1993
High transmission mass spectrometer with improved optical coupling
CAMECA10 citations69
US4508967AApr 2, 1985
Electronic optical apparatus comprising pyrolytic graphite elements
CAMECA14 citations67
US4983831AJan 8, 1991
Time-of-flight analysis method with continuous scanning and analyzer to implement this method
CAMECA18 citations66
US4912325AMar 27, 1990
Method for sample analysis by sputtering with a particle beam, and device to implement said method
CAMECA9 citations64
US5038045AAug 6, 1991
Composite electromagnetic lens with variable focal distance
CAMECA7 citations61
US4171482AOct 16, 1979
Mass spectrometer for ultra-rapid scanning
CAMECA10 citations59
US4036777AJul 19, 1977
Ion current measuring arrangement
CAMECA5 citations54
US7049588B2May 23, 2006
Device for measuring the emission of X-rays produced by an object exposed to an electron beam
CAMECA2 citations52
US8373121B2Feb 12, 2013
Magnetic achromatic mass spectrometer with double focusing
CAMECA0 citations39