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CANDELA INSTR
US12 patents
Top patents by PatentIndex Score
US6757056B1Jun 29, 2004
Combined high speed optical profilometer and ellipsometer
CANDELA INSTR91 citations98
US6392749B1May 21, 2002
High speed optical profilometer for measuring surface height variation
CANDELA INSTR123 citations98
US6717671B1Apr 6, 2004
System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern
CANDELA INSTR48 citations96
US6268919B1Jul 31, 2001
System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations
CANDELA INSTR47 citations96
US6229610B1May 8, 2001
System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation
CANDELA INSTR33 citations96
US6130749AOct 10, 2000
System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation
CANDELA INSTR40 citations96
US6031615AFeb 29, 2000
System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness
CANDELA INSTR74 citations96
US6665078B1Dec 16, 2003
System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers
CANDELA INSTR36 citations92
US6781103B1Aug 24, 2004
Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks
CANDELA INSTR42 citations87
US7123357B2Oct 17, 2006
Method of detecting and classifying scratches and particles on thin film disks or wafers
CANDELA INSTR16 citations84
US6909500B2Jun 21, 2005
Method of detecting and classifying scratches, particles and pits on thin film disks or wafers
CANDELA INSTR7 citations74
US6897957B2May 24, 2005
Material independent optical profilometer
CANDELA INSTR8 citations74