Assignee
CASCADE MICROTECH INC
US239 patents
Top patents by PatentIndex Score
US7009383B2Mar 7, 2006
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC113 citations99
US6815963B2Nov 9, 2004
Probe for testing a device under test
CASCADE MICROTECH INC80 citations99
US6335628B2Jan 1, 2002
Wafer probe station for low-current measurements
CASCADE MICROTECH INC102 citations99
US6232788B1May 15, 2001
Wafer probe station for low-current measurements
CASCADE MICROTECH INC98 citations99
US6137302AOct 24, 2000
Low-current probe card with reduced triboelectric current generating cables
CASCADE MICROTECH INC127 citations99
US5729150AMar 17, 1998
Low-current probe card with reduced triboelectric current generating cables
CASCADE MICROTECH INC187 citations99
US5604444AFeb 18, 1997
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC107 citations99
US5457398AOct 10, 1995
Wafer probe station having full guarding
CASCADE MICROTECH INC149 citations99
US5266889ANov 30, 1993
Wafer probe station with integrated environment control enclosure
CASCADE MICROTECH INC172 citations99
US4849689AJul 18, 1989
Microwave wafer probe having replaceable probe tip
CASCADE MICROTECH INC148 citations99
US7161363B2Jan 9, 2007
Probe for testing a device under test
CASCADE MICROTECH INC64 citations98
US6847219B1Jan 25, 2005
Probe station with low noise characteristics
CASCADE MICROTECH INC116 citations98
US6842024B2Jan 11, 2005
Probe station having multiple enclosures
CASCADE MICROTECH INC84 citations98
US6806724B2Oct 19, 2004
Probe for combined signals
CASCADE MICROTECH INC104 citations98
US6724205B1Apr 20, 2004
Probe for combined signals
CASCADE MICROTECH INC110 citations98
US6549106B2Apr 15, 2003
Waveguide with adjustable backshort
CASCADE MICROTECH INC347 citations98
US6256882B1Jul 10, 2001
Membrane probing system
CASCADE MICROTECH INC118 citations98
US5914613AJun 22, 1999
Membrane probing system with local contact scrub
CASCADE MICROTECH INC200 citations98
US5869975AFeb 9, 1999
System for evaluating probing networks that have multiple probing ends
CASCADE MICROTECH INC90 citations98
US5345170ASep 6, 1994
Wafer probe station having integrated guarding, Kelvin connection and shielding systems
CASCADE MICROTECH INC166 citations98
US5045781ASep 3, 1991
High-frequency active probe having replaceable contact needles
CASCADE MICROTECH INC123 citations98
US4827211AMay 2, 1989
Wafer probe
CASCADE MICROTECH INC144 citations98
US7187188B2Mar 6, 2007
Chuck with integrated wafer support
CASCADE MICROTECH INC90 citations97
US6930498B2Aug 16, 2005
Membrane probing system
CASCADE MICROTECH INC68 citations97
US6720782B2Apr 13, 2004
Wafer probe station for low-current measurements
CASCADE MICROTECH INC53 citations97
US6608496B1Aug 19, 2003
Reference transmission line junction for probing device
CASCADE MICROTECH INC63 citations97
US6578264B1Jun 17, 2003
Method for constructing a membrane probe using a depression
CASCADE MICROTECH INC96 citations97
US6492822B2Dec 10, 2002
Wafer probe station for low-current measurements
CASCADE MICROTECH INC64 citations97
US6232789B1May 15, 2001
Probe holder for low current measurements
CASCADE MICROTECH INC94 citations97
US5963027AOct 5, 1999
Probe station having environment control chambers with orthogonally flexible lateral wall assembly
CASCADE MICROTECH INC90 citations97
US5663653ASep 2, 1997
Wafer probe station for low-current measurements
CASCADE MICROTECH INC91 citations97
US5659255AAug 19, 1997
Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels
CASCADE MICROTECH INC64 citations97
US5610529AMar 11, 1997
Probe station having conductive coating added to thermal chuck insulator
CASCADE MICROTECH INC182 citations97
US5565788AOct 15, 1996
Coaxial wafer probe with tip shielding
CASCADE MICROTECH INC197 citations97
US5561377AOct 1, 1996
System for evaluating probing networks
CASCADE MICROTECH INC84 citations97
US5532609AJul 2, 1996
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC89 citations97
US4697143ASep 29, 1987
Wafer probe
CASCADE MICROTECH INC257 citations97
US7271603B2Sep 18, 2007
Shielded probe for testing a device under test
CASCADE MICROTECH INC51 citations96
US7250779B2Jul 31, 2007
Probe station with low inductance path
CASCADE MICROTECH INC42 citations96
US7233160B2Jun 19, 2007
Wafer probe
CASCADE MICROTECH INC39 citations96
US7109731B2Sep 19, 2006
Membrane probing system with local contact scrub
CASCADE MICROTECH INC40 citations96
US7068057B2Jun 27, 2006
Low-current pogo probe card
CASCADE MICROTECH INC27 citations96
US6801047B2Oct 5, 2004
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC51 citations96
US6642732B2Nov 4, 2003
Probe station thermal chuck with shielding for capacitive current
CASCADE MICROTECH INC52 citations96
US6636059B2Oct 21, 2003
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC57 citations96
US6512391B2Jan 28, 2003
Probe station thermal chuck with shielding for capacitive current
CASCADE MICROTECH INC42 citations96
US6486687B2Nov 26, 2002
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC59 citations96
US6445202B1Sep 3, 2002
Probe station thermal chuck with shielding for capacitive current
CASCADE MICROTECH INC56 citations96
US6437584B1Aug 20, 2002
Membrane probing system with local contact scrub
CASCADE MICROTECH INC33 citations96
US6380751B2Apr 30, 2002
Wafer probe station having environment control enclosure
CASCADE MICROTECH INC54 citations96
Showing the top 50 of 239 patents by PatentIndex Score.