Assignee
CASCADE MICROTECH INC
US·239 granted patents·25 pending applications·8,834 citations·filing 1984–2018
Top patents by PatentIndex Score
264 records- 0198US7271603B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2006·Granted Sep 18, 2007·51 cites·53 claims
- 0298US6842024B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2003·Granted Jan 11, 2005·84 cites·3 claims
- 0398US6806724B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2003·Granted Oct 19, 2004·104 cites·8 claims
- 0498US6724205B1Probe for combined signalsCASCADE MICROTECH INC·Filed 2002·Granted Apr 20, 2004·110 cites·12 claims
- 0598US6549106B2Waveguide with adjustable backshortCASCADE MICROTECH INC·Filed 2001·Granted Apr 15, 2003·347 cites·19 claims
- 0698US6256882B1Membrane probing systemCASCADE MICROTECH INC·Filed 1998·Granted Jul 10, 2001·118 cites·35 claims
- 0798US5914613AMembrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 1996·Granted Jun 22, 1999·200 cites·15 claims
- 0898US5729150ALow-current probe card with reduced triboelectric current generating cablesCASCADE MICROTECH INC·Filed 1995·Granted Mar 17, 1998·187 cites·13 claims
- 0998US4697143AWafer probeCASCADE MICROTECH INC·Filed 1984·Granted Sep 29, 1987·257 cites·28 claims
- 1097US7626379B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2007·Granted Dec 1, 2009·39 cites·15 claims
- 1197US7403028B2Test structure and probe for differential signalsCASCADE MICROTECH INC·Filed 2007·Granted Jul 22, 2008·42 cites·3 claims
- 1297US7109731B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2005·Granted Sep 19, 2006·40 cites·15 claims
- 1397US7009383B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2004·Granted Mar 7, 2006·113 cites·8 claims
- 1497US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 1597US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 1697US6137302ALow-current probe card with reduced triboelectric current generating cablesCASCADE MICROTECH INC·Filed 1997·Granted Oct 24, 2000·127 cites·8 claims
- 1797US5610529AProbe station having conductive coating added to thermal chuck insulatorCASCADE MICROTECH INC·Filed 1995·Granted Mar 11, 1997·182 cites·18 claims
- 1897US5565788ACoaxial wafer probe with tip shieldingCASCADE MICROTECH INC·Filed 1995·Granted Oct 15, 1996·197 cites·4 claims
- 1997US5506515AHigh-frequency probe tip assemblyCASCADE MICROTECH INC·Filed 1994·Granted Apr 9, 1996·250 cites·15 claims
- 2097US4849689AMicrowave wafer probe having replaceable probe tipCASCADE MICROTECH INC·Filed 1988·Granted Jul 18, 1989·148 cites·12 claims
- 2196US7187188B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2004·Granted Mar 6, 2007·90 cites·19 claims
- 2296US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 2396US7068057B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2005·Granted Jun 27, 2006·27 cites·11 claims
- 2496US6930498B2Membrane probing systemCASCADE MICROTECH INC·Filed 2004·Granted Aug 16, 2005·68 cites·1 claims
- 2596US6847219B1Probe station with low noise characteristicsCASCADE MICROTECH INC·Filed 2003·Granted Jan 25, 2005·116 cites·12 claims
- 2696US6608496B1Reference transmission line junction for probing deviceCASCADE MICROTECH INC·Filed 2000·Granted Aug 19, 2003·63 cites·6 claims
- 2796US6578264B1Method for constructing a membrane probe using a depressionCASCADE MICROTECH INC·Filed 2000·Granted Jun 17, 2003·96 cites·40 claims
- 2896US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 2996US6362636B1Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2001·Granted Mar 26, 2002·58 cites·1 claims
- 3096US5457398AWafer probe station having full guardingCASCADE MICROTECH INC·Filed 1993·Granted Oct 10, 1995·149 cites·22 claims
- 3196US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 3295US7876114B2Differential waveguide probeCASCADE MICROTECH INC·Filed 2008·Granted Jan 25, 2011·42 cites·20 claims
- 3395US7533462B2Method of constructing a membrane probeCASCADE MICROTECH INC·Filed 2006·Granted May 19, 2009·25 cites·15 claims
- 3495US7518358B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·17 cites·12 claims
- 3595US7148711B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Dec 12, 2006·25 cites·1 claims
- 3695US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 3795US6639415B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2002·Granted Oct 28, 2003·52 cites·3 claims
- 3895US6636059B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Oct 21, 2003·57 cites·15 claims
- 3995US6489789B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2001·Granted Dec 3, 2002·53 cites·1 claims
- 4095US6486687B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Nov 26, 2002·59 cites·7 claims
- 4195US5869975ASystem for evaluating probing networks that have multiple probing endsCASCADE MICROTECH INC·Filed 1997·Granted Feb 9, 1999·90 cites·12 claims
- 4295US5604444AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1996·Granted Feb 18, 1997·107 cites·9 claims
- 4395US5561377ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1995·Granted Oct 1, 1996·84 cites·12 claims
- 4495US5045781AHigh-frequency active probe having replaceable contact needlesCASCADE MICROTECH INC·Filed 1991·Granted Sep 3, 1991·123 cites·6 claims
- 4595US4858160ASystem for setting reference reactance for vector corrected measurementsCASCADE MICROTECH INC·Filed 1988·Granted Aug 15, 1989·112 cites·19 claims
- 4695US4764723AWafer probeCASCADE MICROTECH INC·Filed 1986·Granted Aug 16, 1988·103 cites·17 claims
- 4794US7893704B2Membrane probing structure with laterally scrubbing contactsCASCADE MICROTECH INC·Filed 2009·Granted Feb 22, 2011·18 cites·34 claims
- 4894US7888957B2Probing apparatus with impedance optimized interfaceCASCADE MICROTECH INC·Filed 2008·Granted Feb 15, 2011·28 cites·13 claims
- 4994US7764072B2Differential signal probing systemCASCADE MICROTECH INC·Filed 2007·Granted Jul 27, 2010·26 cites·26 claims
- 5094US7501810B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 10, 2009·16 cites·10 claims
Showing the top 50 of 264 patent records by PatentIndex Score.
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