Assignee
CERPROBE CORP
US·13 granted patents·1,465 citations·filing 1977–2000
Top patents by PatentIndex Score
13 records- 0194US5828226AProbe card assembly for high density integrated circuitsCERPROBE CORP·Filed 1996·Granted Oct 27, 1998·231 cites·11 claims
- 0293US6559665B1Test socket for an IC deviceCERPROBE CORP·Filed 2000·Granted May 6, 2003·82 cites·13 claims
- 0393US6297654B1Test socket and method for testing an IC device in a dead bug orientationCERPROBE CORP·Filed 2000·Granted Oct 2, 2001·73 cites·24 claims
- 0493US5923178AProbe assembly and method for switchable multi-DUT testing of integrated circuit wafersCERPROBE CORP·Filed 1997·Granted Jul 13, 1999·145 cites·8 claims
- 0593US4161692AProbe device for integrated circuit wafersCERPROBE CORP·Filed 1977·Granted Jul 17, 1979·207 cites·12 claims
- 0692US6208155B1Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit deviceCERPROBE CORP·Filed 1998·Granted Mar 27, 2001·118 cites·16 claims
- 0790US6220870B1IC chip socket and methodCERPROBE CORP·Filed 1998·Granted Apr 24, 2001·73 cites·17 claims
- 0888US5382898AHigh density probe card for testing electrical circuitsCERPROBE CORP·Filed 1992·Granted Jan 17, 1995·183 cites·13 claims
- 0986US6002426AInverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuitsCERPROBE CORP·Filed 1997·Granted Dec 14, 1999·168 cites·19 claims
- 1081US6114869AMethod and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cardsCERPROBE CORP·Filed 1998·Granted Sep 5, 2000·68 cites·16 claims
- 1173US5066907AProbe system for device and circuit testingCERPROBE CORP·Filed 1990·Granted Nov 19, 1991·48 cites·7 claims
- 1270US6354859B1Cover assembly for an IC socketCERPROBE CORP·Filed 1999·Granted Mar 12, 2002·41 cites·2 claims
- 1366US6426637B1Alignment guide and signal transmission apparatus and method for spring contact probe needlesCERPROBE CORP·Filed 1999·Granted Jul 30, 2002·28 cites·40 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →