Assignee
CHINA JILIANG UNIV
CN·2 granted patents·0 citations·filing 2024–2025
Top patents by PatentIndex Score
2 records- 0154US12590988B1Reference sample suitable to calibrate magnetic microscope's probe tip and calibration methodCHINA JILIANG UNIV·Filed 2025·Granted Mar 31, 2026·0 cites·10 claims
- 0235US12597938B2Method for measuring DAC nonlinearity error based on pseudo-random sequenceCHINA JILIANG UNIV·Filed 2024·Granted Apr 7, 2026·0 cites·9 claims
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