Assignee
CHO YONG SANG
KR·2 granted patents·1 pending application·5 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0172US8680883B2Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the sameCHO YONG-SANG·Filed 2011·Granted Mar 25, 2014·4 cites·16 claims
- 0250US8822857B2Handle for doors or panels, especially for vehiclesCHO YONG-SANG·Filed 2009·Granted Sep 2, 2014·1 cites·15 claims
- 0333US2012112311A1Electrical Fuses Using Junction Breakdown and Semiconductor Integrated Circuits Including the SameCHO YONG SANG·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →