Assignee
CHOI HONG-SOK
KR·4 granted patents·3 pending applications·1 citations·filing 2009–2012
Top patents by PatentIndex Score
7 records- 0159US9310430B2Semiconductor integrated circuit and test control method thereofCHOI HONG-SOK·Filed 2012·Granted Apr 12, 2016·1 cites·17 claims
- 0248US8786302B2Test circuit for use in a semiconductor apparatusCHOI HONG-SOK·Filed 2011·Granted Jul 22, 2014·0 cites·5 claims
- 0346US2010244882A1Burn-In Test Method and SystemCHOI HONG-SOK·Filed 2009·Application pending·0 cites
- 0439US8102722B2Data output device for semiconductor memory apparatusCHOI HONG-SOK·Filed 2009·Granted Jan 24, 2012·0 cites·20 claims
- 0535US8627134B2Semiconductor apparatus and local skew detecting circuit thereforCHOI HONG-SOK·Filed 2011·Granted Jan 7, 2014·0 cites·19 claims
- 0632US2012126874A1Integrated circuitCHOI HONG-SOK·Filed 2010·Application pending·0 cites
- 0730US2012002491A1Test signal generating device, semiconductor memory apparatus using the same and multi-bit test method thereofCHOI HONG SOK·Filed 2010·Application pending·0 cites
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