Assignee
CO OPERATIVE FACILITY FOR AGIN
JP·2 granted patents·238 citations·filing 1995–1995
Technology mixG01R2
Top patents by PatentIndex Score
2 records- 0186US5555422AProber for semiconductor integrated circuit element waferCO OPERATIVE FACILITY FOR AGIN·Filed 1995·Granted Sep 10, 1996·183 cites·9 claims
- 0275US5534786ABurn-in and test method of semiconductor wafers and burn-in boards for use in semiconductor wafer burn-in testsCO OPERATIVE FACILITY FOR AGIN·Filed 1995·Granted Jul 9, 1996·55 cites·2 claims
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