Assignee
CREDENCE SYSTEMS CORP
US·247 granted patents·12 pending applications·6,552 citations·filing 1989–2008
Top patents by PatentIndex Score
259 records- 0196US7042563B2Optical coupling for testing integrated circuitsCREDENCE SYSTEMS CORP·Filed 2005·Granted May 9, 2006·35 cites·12 claims
- 0295US6028439AModular integrated circuit tester with distributed synchronization and controlCREDENCE SYSTEMS CORP·Filed 1997·Granted Feb 22, 2000·161 cites·13 claims
- 0394US6356224B1Arbitrary waveform generator having programmably configurable architectureCREDENCE SYSTEMS CORP·Filed 1999·Granted Mar 12, 2002·195 cites·22 claims
- 0494US5883523ACoherent switching power for an analog circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Mar 16, 1999·136 cites·13 claims
- 0593US6836131B2Spray cooling and transparent cooling plate thermal management systemCREDENCE SYSTEMS CORP·Filed 2003·Granted Dec 28, 2004·58 cites·30 claims
- 0693US5684421ACompensated delay locked loop timing vernierCREDENCE SYSTEMS CORP·Filed 1995·Granted Nov 4, 1997·165 cites·17 claims
- 0792US6587979B1Partitionable embedded circuit test system for integrated circuitCREDENCE SYSTEMS CORP·Filed 2000·Granted Jul 1, 2003·130 cites·16 claims
- 0892US5963074AProgrammable delay circuit having calibratable delaysCREDENCE SYSTEMS CORP·Filed 1997·Granted Oct 5, 1999·92 cites·12 claims
- 0992US5712883AClock signal distribution systemCREDENCE SYSTEMS CORP·Filed 1996·Granted Jan 27, 1998·109 cites·27 claims
- 1092US5371851AGraphical data base editorCREDENCE SYSTEMS CORP·Filed 1989·Granted Dec 6, 1994·252 cites·9 claims
- 1191US7761751B1Test and diagnosis of semiconductorsCREDENCE SYSTEMS CORP·Filed 2007·Granted Jul 20, 2010·19 cites·20 claims
- 1291US6859031B2Apparatus and method for dynamic diagnostic testing of integrated circuitsCREDENCE SYSTEMS CORP·Filed 2002·Granted Feb 22, 2005·79 cites·19 claims
- 1391US6812464B1Superconducting single photon detectorCREDENCE SYSTEMS CORP·Filed 2000·Granted Nov 2, 2004·101 cites·4 claims
- 1491US6377062B1Floating interface for integrated circuit test headCREDENCE SYSTEMS CORP·Filed 2000·Granted Apr 23, 2002·73 cites·28 claims
- 1591US6105157ASalphasic timing calibration system for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1998·Granted Aug 15, 2000·87 cites·18 claims
- 1691US6011403ACircuit arrangement for measuring leakage current utilizing a differential integrating capacitorCREDENCE SYSTEMS CORP·Filed 1997·Granted Jan 4, 2000·95 cites·5 claims
- 1790US7243278B2Integrated circuit tester with software-scaleable channelsCREDENCE SYSTEMS CORP·Filed 2005·Granted Jul 10, 2007·22 cites·15 claims
- 1890US6396706B1Self-heating circuit boardCREDENCE SYSTEMS CORP·Filed 1999·Granted May 28, 2002·84 cites·12 claims
- 1989US7135678B2Charged particle guideCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 14, 2006·52 cites·22 claims
- 2089US6797581B2Avalanche photodiode for photon counting applications and method thereofCREDENCE SYSTEMS CORP·Filed 2003·Granted Sep 28, 2004·47 cites·30 claims
- 2189US6778327B2Bi-convex solid immersion lensCREDENCE SYSTEMS CORP·Filed 2003·Granted Aug 17, 2004·33 cites·20 claims
- 2289US6040691ATest head for integrated circuit tester arranging tester component circuit boards on three dimensionsCREDENCE SYSTEMS CORP·Filed 1997·Granted Mar 21, 2000·84 cites·35 claims
- 2387US6484117B1Predictive temperature control system for an integrated circuitCREDENCE SYSTEMS CORP·Filed 2000·Granted Nov 19, 2002·41 cites·22 claims
- 2487US6154715AIntegrated circuit tester with real time branchingCREDENCE SYSTEMS CORP·Filed 1999·Granted Nov 28, 2000·69 cites·7 claims
- 2587US5974579AEfficient built-in self test for embedded memories with differing address spacesCREDENCE SYSTEMS CORP·Filed 1996·Granted Oct 26, 1999·74 cites·22 claims
- 2686US7297948B2Column simultaneously focusing a particle beam and an optical beamCREDENCE SYSTEMS CORP·Filed 2005·Granted Nov 20, 2007·10 cites·11 claims
- 2786US7224828B2Time resolved non-invasive diagnostics systemCREDENCE SYSTEMS CORP·Filed 2003·Granted May 29, 2007·27 cites·20 claims
- 2886US7120840B1Method and system for improved ATE timing calibration at a device under testCREDENCE SYSTEMS CORP·Filed 2004·Granted Oct 10, 2006·33 cites·32 claims
- 2986US6859902B1Method and apparatus for high speed IC test interfaceCREDENCE SYSTEMS CORP·Filed 2000·Granted Feb 22, 2005·36 cites·7 claims
- 3086US6304989B1Built-in spare row and column replacement analysis system for embedded memoriesCREDENCE SYSTEMS CORP·Filed 1999·Granted Oct 16, 2001·76 cites·18 claims
- 3186US5748642AParallel processing integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1995·Granted May 5, 1998·49 cites·7 claims
- 3285US6085346AMethod and apparatus for built-in self test of integrated circuitsCREDENCE SYSTEMS CORP·Filed 1996·Granted Jul 4, 2000·71 cites·18 claims
- 3385US5935256AParallel processing integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1998·Granted Aug 10, 1999·46 cites·5 claims
- 3484US6594604B2S-parameter measurement system for wideband non-linear networksCREDENCE SYSTEMS CORP·Filed 2001·Granted Jul 15, 2003·32 cites·25 claims
- 3584US6040700ASemiconductor tester system including test head supported by wafer prober frameCREDENCE SYSTEMS CORP·Filed 1997·Granted Mar 21, 2000·77 cites·14 claims
- 3684US5994938ASelf-calibrating programmable phase shifterCREDENCE SYSTEMS CORP·Filed 1998·Granted Nov 30, 1999·47 cites·24 claims
- 3784US5068601ADual function cam-ring system for DUT board parallel electrical inter-connection and prober/handler dockingCREDENCE SYSTEMS CORP·Filed 1991·Granted Nov 26, 1991·74 cites·10 claims
- 3883US7327452B2Light beam apparatus and method for orthogonal alignment of specimenCREDENCE SYSTEMS CORP·Filed 2004·Granted Feb 5, 2008·26 cites·27 claims
- 3983US6976234B2Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuitsCREDENCE SYSTEMS CORP·Filed 2003·Granted Dec 13, 2005·24 cites·38 claims
- 4083US6967491B2Spatial and temporal selective laser assisted fault localizationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 22, 2005·32 cites·48 claims
- 4183US6087843AIntegrated circuit tester with test head including regulating capacitorCREDENCE SYSTEMS CORP·Filed 1997·Granted Jul 11, 2000·60 cites·1 claims
- 4283US5999044ADifferential driver having multiple output voltage rangesCREDENCE SYSTEMS CORP·Filed 1998·Granted Dec 7, 1999·53 cites·16 claims
- 4382US7765443B1Test systems and methods for integrated circuit devicesCREDENCE SYSTEMS CORP·Filed 2004·Granted Jul 27, 2010·28 cites·19 claims
- 4482US7400154B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted Jul 15, 2008·10 cites·37 claims
- 4582US7135123B1Method and system for integrated circuit backside navigationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 14, 2006·30 cites·21 claims
- 4682US7115426B2Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrateCREDENCE SYSTEMS CORP·Filed 2005·Granted Oct 3, 2006·9 cites·19 claims
- 4782US7035755B2Circuit testing with ring-connected test instrument modulesCREDENCE SYSTEMS CORP·Filed 2002·Granted Apr 25, 2006·24 cites·33 claims
- 4882US6674628B1Pulse-width modulated relayCREDENCE SYSTEMS CORP·Filed 2002·Granted Jan 6, 2004·25 cites·35 claims
- 4982US6128188ASelf-balancing thermal control device for integrated circuitsCREDENCE SYSTEMS CORP·Filed 1999·Granted Oct 3, 2000·63 cites·8 claims
- 5082US5951705AIntegrated circuit tester having pattern generator controlled data busCREDENCE SYSTEMS CORP·Filed 1997·Granted Sep 14, 1999·55 cites·20 claims
Showing the top 50 of 259 patent records by PatentIndex Score.
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