Assignee
CYRA TECHNOLOGIES INC
US·10 granted patents·1,862 citations·filing 1996–2002
Top patents by PatentIndex Score
10 records- 0198US6512993B2Integrated system for quickly and accurately imaging and modeling three-dimensional objectsCYRA TECHNOLOGIES INC·Filed 2001·Granted Jan 28, 2003·153 cites·18 claims
- 0298US5988862AIntegrated system for quickly and accurately imaging and modeling three dimensional objectsCYRA TECHNOLOGIES INC·Filed 1996·Granted Nov 23, 1999·669 cites·20 claims
- 0397US6330523B1Integrated system for quickly and accurately imaging and modeling three-dimensional objectsCYRA TECHNOLOGIES INC·Filed 1998·Granted Dec 11, 2001·315 cites·6 claims
- 0496US6512518B2Integrated system for quickly and accurately imaging and modeling three-dimensional objectsCYRA TECHNOLOGIES INC·Filed 2002·Granted Jan 28, 2003·105 cites·1 claims
- 0595US6619406B1Advanced applications for 3-D autoscanning LIDAR systemCYRA TECHNOLOGIES INC·Filed 2000·Granted Sep 16, 2003·71 cites·2 claims
- 0695US6420698B1Integrated system for quickly and accurately imaging and modeling three-dimensional objectsCYRA TECHNOLOGIES INC·Filed 1998·Granted Jul 16, 2002·285 cites·6 claims
- 0793US6734849B2Integrated system for quickly and accurately imaging and modeling three-dimensional objectsCYRA TECHNOLOGIES INC·Filed 2002·Granted May 11, 2004·80 cites·3 claims
- 0892US6473079B1Integrated system for quickly and accurately imaging and modeling three-dimensional objectsCYRA TECHNOLOGIES INC·Filed 1998·Granted Oct 29, 2002·114 cites·5 claims
- 0988US6604068B1System and method for concurrently modeling any element of a modelCYRA TECHNOLOGIES INC·Filed 2000·Granted Aug 5, 2003·55 cites·27 claims
- 1069US6633290B1Apparatus and method for forming 2D views of a structure from 3D point dataCYRA TECHNOLOGIES INC·Filed 2000·Granted Oct 14, 2003·15 cites·25 claims
Join the waitlist — get patent alerts
Get an alert when CYRA TECHNOLOGIES INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →