Assignee
DAGE PREC IND LTD
US·5 granted patents·62 citations·filing 1998–2010
Top patents by PatentIndex Score
5 records- 0183US7555961B2Test apparatusDAGE PREC IND LTD·Filed 2005·Granted Jul 7, 2009·9 cites·10 claims
- 0268US8015883B2High speed pull test device and methodDAGE PREC IND LTD·Filed 2010·Granted Sep 13, 2011·3 cites·14 claims
- 0363US6237422B1Apparatus and method for testing strength of electrical bond sites on semiconductor devicesDAGE PREC IND LTD·Filed 1998·Granted May 29, 2001·27 cites·10 claims
- 0457US6178823B1Apparatus and method for testing bond strength of electrical connectionDAGE PREC IND LTD·Filed 1999·Granted Jan 30, 2001·23 cites·10 claims
- 0538US7856889B2High speed pull test device and methodDAGE PREC IND LTD·Filed 2005·Granted Dec 28, 2010·0 cites·18 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →