Assignee
DATA MEASUREMENT CORP
US·4 granted patents·58 citations·filing 1981–1993
Top patents by PatentIndex Score
4 records- 0161US4574387AApparatus and method for measuring thicknessDATA MEASUREMENT CORP·Filed 1981·Granted Mar 4, 1986·20 cites·8 claims
- 0257US5113421AMethod and apparatus for measuring the thickness of a coating on a substrateDATA MEASUREMENT CORP·Filed 1989·Granted May 12, 1992·24 cites·16 claims
- 0335US5388341AVirtual two gauge profile systemDATA MEASUREMENT CORP·Filed 1993·Granted Feb 14, 1995·6 cites·22 claims
- 0428US5400380ADynamic alloy correction gaugeDATA MEASUREMENT CORP·Filed 1992·Granted Mar 21, 1995·8 cites·10 claims
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