Assignee
DAYCOCK DAVID A
US·2 granted patents·0 citations·filing 2006–2012
Technology mixH10P2
Top patents by PatentIndex Score
2 records- 0147US8563435B2Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrateDAYCOCK DAVID A·Filed 2012·Granted Oct 22, 2013·0 cites·18 claims
- 0245US8334209B2Method of reducing electron beam damage on post W-CMP wafersDAYCOCK DAVID A·Filed 2006·Granted Dec 18, 2012·0 cites·20 claims
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