Assignee
DE HO WEI
TW·2 granted patents·3,130 citations·filing 2012–2012
Top patents by PatentIndex Score
2 records- 0197US9236267B2Cut-mask patterning process for fin-like field effect transistor (FinFET) deviceDE HO WEI·Filed 2012·Granted Jan 12, 2016·3.1k cites·20 claims
- 0294US8741776B2Patterning process for fin-like field effect transistor (finFET) deviceDE HO WEI·Filed 2012·Granted Jun 3, 2014·35 cites·20 claims
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