Assignee
DEWA HARUTADA
JP3 patents
Top patents by PatentIndex Score
US9778284B2Oct 3, 2017
Semiconductor probe, testing device and testing method for testing quantum battery
DEWA HARUTADA3 citations69
US9164149B2Oct 20, 2015
Testing device and testing method for quantum battery using semiconductor probe
DEWA HARUTADA2 citations57
US10036780B2Jul 31, 2018
Evaluation apparatus and evaluation method of sheet type cell
DEWA HARUTADA0 citations36