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DFT MICROSYSTEMS INC
US5 patents
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US7917319B2Mar 29, 2011
Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits
DFT MICROSYSTEMS INC10 citations81
US7813297B2Oct 12, 2010
High-speed signal testing system having oscilloscope functionality
DFT MICROSYSTEMS INC14 citations81
US7681091B2Mar 16, 2010
Signal integrity measurement systems and methods using a predominantly digital time-base generator
DFT MICROSYSTEMS INC17 citations81
US7315574B2Jan 1, 2008
System and method for generating a jittered test signal
DFT MICROSYSTEMS INC16 citations79
US7242209B2Jul 10, 2007
System and method for testing integrated circuits
DFT MICROSYSTEMS INC13 citations79