Assignee
DIRECT ELECTRON LP
US·5 granted patents·4 pending applications·25 citations·filing 2008–2025
Top patents by PatentIndex Score
9 records- 0184US7851764B2Method of high-energy particle imaging by computing a difference between sampled pixel voltagesDIRECT ELECTRON LP·Filed 2009·Granted Dec 14, 2010·10 cites·15 claims
- 0283US11310438B2System, apparatus, and method for determining elemental composition using 4D STEMDIRECT ELECTRON LP·Filed 2020·Granted Apr 19, 2022·2 cites·7 claims
- 0382US7952073B2Apparatus and method including a direct bombardment detector and a secondary detector for use in electron microscopyDIRECT ELECTRON LP·Filed 2008·Granted May 31, 2011·8 cites·35 claims
- 0478US8809781B1Method of electron beam imaging of a specimen by combining images of an image sequenceDIRECT ELECTRON LP·Filed 2014·Granted Aug 19, 2014·5 cites·19 claims
- 0567US2025266239A1Charged particle beam distortion correction methodDIRECT ELECTRON LP·Filed 2025·Application pending·0 cites
- 0667US2025266232A1Charged particle beam distortion correction methodDIRECT ELECTRON LP·Filed 2025·Application pending·0 cites
- 0753US11252339B2Apparatus and method for high dynamic range counting by pixelated detectorsDIRECT ELECTRON LP·Filed 2020·Granted Feb 15, 2022·0 cites·20 claims
- 0845US2023326939A1High-dqe direct detection image sensor for electrons with 40 - 120 kev energyDIRECT ELECTRON LP·Filed 2021·Application pending·0 cites
- 0943US2023145436A1Method and apparatus for energy selective direct electron imagingDIRECT ELECTRON LP·Filed 2021·Application pending·0 cites
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