Assignee
DOKKEN RICHARD C
US·2 granted patents·7 citations·filing 2007–2007
Technology mixG01R2
Top patents by PatentIndex Score
2 records- 0165US8615691B2Process for improving design-limited yield by localizing potential faults from production test dataDOKKEN RICHARD C·Filed 2007·Granted Dec 24, 2013·5 cites·13 claims
- 0252US8060851B2Method for operating a secure semiconductor IP server to support failure analysisDOKKEN RICHARD C·Filed 2007·Granted Nov 15, 2011·2 cites·15 claims
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