Assignee
DREXELBROOK CONTROLS
US·26 granted patents·703 citations·filing 1974–1997
Top patents by PatentIndex Score
26 records- 0191US4146834AAdmittance measuring system for monitoring the condition of materialsDREXELBROOK CONTROLS·Filed 1976·Granted Mar 27, 1979·52 cites·35 claims
- 0288US4235106ASystem and method for obtaining compensated level measurementsDREXELBROOK CONTROLS·Filed 1978·Granted Nov 25, 1980·43 cites·26 claims
- 0385US4757252AProbe system for measuring the condition of materialsDREXELBROOK CONTROLS·Filed 1985·Granted Jul 12, 1988·55 cites·22 claims
- 0481US6062070AMethod and apparatus for the sonic measurement of sludge and clarity conditions during the treatment of waste waterDREXELBROOK CONTROLS·Filed 1996·Granted May 16, 2000·55 cites·25 claims
- 0581US4723122ARemotely calibratable instrument systemDREXELBROOK CONTROLS·Filed 1985·Granted Feb 2, 1988·35 cites·99 claims
- 0681US4166388ARF Admittance measuring method and apparatus for determining the level of a conductive liquidDREXELBROOK CONTROLS·Filed 1977·Granted Sep 4, 1979·29 cites·8 claims
- 0780US4232300ALevel measuring system using admittance sensingDREXELBROOK CONTROLS·Filed 1978·Granted Nov 4, 1980·28 cites·12 claims
- 0879US5510779AError compensating instrument system with digital communicationsDREXELBROOK CONTROLS·Filed 1993·Granted Apr 23, 1996·58 cites·22 claims
- 0978US4208909AAdmittance sensing probe having multiple sensing elementsDREXELBROOK CONTROLS·Filed 1978·Granted Jun 24, 1980·26 cites·26 claims
- 1077US4568874ARF Admittance apparatus and method for monitoring the contents of a pipeDREXELBROOK CONTROLS·Filed 1983·Granted Feb 4, 1986·29 cites·11 claims
- 1176US4788488AContinuous condition sensing systemDREXELBROOK CONTROLS·Filed 1986·Granted Nov 29, 1988·32 cites·6 claims
- 1273US3993947AAdmittance measuring system for monitoring the condition of materialsDREXELBROOK CONTROLS·Filed 1974·Granted Nov 23, 1976·19 cites·28 claims
- 1372US4064753ARF admittance measuring method and apparatus for determining the level of a conductive liquidDREXELBROOK CONTROLS·Filed 1974·Granted Dec 27, 1977·18 cites·40 claims
- 1472US3936738AMethod of and apparatus for measuring the amount of coating material applied to substratesDREXELBROOK CONTROLS·Filed 1974·Granted Feb 3, 1976·17 cites·9 claims
- 1569US5777550AHigh reliability instrument systemDREXELBROOK CONTROLS·Filed 1997·Granted Jul 7, 1998·37 cites·6 claims
- 1667US4332167AMethod of making an RF admittance measuring probe and product thereofDREXELBROOK CONTROLS·Filed 1979·Granted Jun 1, 1982·22 cites·14 claims
- 1765US4301681AMethod of using capacitor probe with a semiconductive electrodeDREXELBROOK CONTROLS·Filed 1979·Granted Nov 24, 1981·17 cites·19 claims
- 1863US4799174AMultiple set point condition monitoring systemsDREXELBROOK CONTROLS·Filed 1987·Granted Jan 17, 1989·22 cites·24 claims
- 1962US5539670ACoating responsive material condition monitoring systemDREXELBROOK CONTROLS·Filed 1994·Granted Jul 23, 1996·22 cites·18 claims
- 2060US4950998AContinuous condition sensing systemDREXELBROOK CONTROLS·Filed 1988·Granted Aug 21, 1990·18 cites·12 claims
- 2158US4849754ARemotely calibratable instrument systemDREXELBROOK CONTROLS·Filed 1988·Granted Jul 18, 1989·14 cites·28 claims
- 2253US4428026ATwo layer probeDREXELBROOK CONTROLS·Filed 1981·Granted Jan 24, 1984·14 cites·19 claims
- 2352US5278513AContinuous condition sensing systemDREXELBROOK CONTROLS·Filed 1991·Granted Jan 11, 1994·13 cites·2 claims
- 2452US5045797AContinuous condition sensing system determining liquid level by admittance measurementDREXELBROOK CONTROLS·Filed 1990·Granted Sep 3, 1991·13 cites·15 claims
- 2550US4511948ATwo layer probeDREXELBROOK CONTROLS·Filed 1984·Granted Apr 16, 1985·12 cites·10 claims
- 2633US5835454ATransducer shroud for improved transducer operation in the treatment of waste waterDREXELBROOK CONTROLS·Filed 1997·Granted Nov 10, 1998·3 cites·14 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →