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ECKERT HAGEN
DE
2 patents
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US8442789B2
May 14, 2013
Method and device for determining a frequency mask for a frequency spectrum
ECKERT HAGEN
103 citations
93
US9244106B2
Jan 26, 2016
Method and device for measuring the phase-noise spectrum of a pulsed sinusoidal signal
ECKERT HAGEN
1 citations
50