Assignee
ENDRESS & HAUSER CONDUCTA INC
US·11 granted patents·1 pending application·28 citations·filing 2009–2021
Top patents by PatentIndex Score
12 records- 0188US9404849B2Micro volume inline optical sensorENDRESS+HAUSER CONDUCTA INC·Filed 2013·Granted Aug 2, 2016·7 cites·19 claims
- 0282US10436709B2Calibration unit for optical detectorENDRESS HAUSER CONDUCTA INC·Filed 2018·Granted Oct 8, 2019·6 cites·20 claims
- 0376US7973923B2Multi-port inline flow cell for use in monitoring multiple parameters in a sanitary process lineENDRESS & HAUSER CONDUCTA INC·Filed 2009·Granted Jul 5, 2011·13 cites·17 claims
- 0473US11747197B2Photometer and method of performing photometric measurements with a photometerENDRESS HAUSER CONDUCTA INC·Filed 2021·Granted Sep 5, 2023·1 cites·20 claims
- 0571US10648944B2Failure analysis of a measuring sensor with an integrated temperature sensorENDRESS HAUSER CONDUCTA INC·Filed 2018·Granted May 12, 2020·1 cites·20 claims
- 0649US11543379B2Method of and apparatus for manufacturing at least one measuring cellENDRESS HAUSER CONDUCTA INC·Filed 2020·Granted Jan 3, 2023·0 cites·14 claims
- 0747US11536686B2Method of manufacturing ion-selective membranesENDRESS HAUSER CONDUCTA INC·Filed 2020·Granted Dec 27, 2022·0 cites·16 claims
- 0847US9949365B2Air cooled inline sensor light source with solid state UV emitterENDRESS HAUSER CONDUCTA INC·Filed 2015·Granted Apr 17, 2018·0 cites·16 claims
- 0946US11543382B2Characterization and failure analysis of a sensor using impedance frequency response spectraENDRESS HAUSER CONDUCTA INC·Filed 2020·Granted Jan 3, 2023·0 cites·17 claims
- 1043US10598630B2Characterization and failure analysis of a sensor using impedance frequency response spectraENDRESS HAUSER CONDUCTA INC·Filed 2016·Granted Mar 24, 2020·0 cites·22 claims
- 1142US11209380B2Sensor with nonporous reference junctionENDRESS HAUSER CONDUCTA INC·Filed 2018·Granted Dec 28, 2021·0 cites·18 claims
- 1232US2015189714A1Sensors with LED Light SourcesENDRESS & HAUSER CONDUCTA INC·Filed 2013·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →