Assignee
ENYAMA MOMOYO
JP·4 granted patents·24 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0187US8330103B2Charged particle beam apparatus and specimen inspection methodENYAMA MOMOYO·Filed 2008·Granted Dec 11, 2012·13 cites·17 claims
- 0281US8592776B2Charged particle beam apparatusENYAMA MOMOYO·Filed 2009·Granted Nov 26, 2013·6 cites·10 claims
- 0371US8907278B2Charged particle beam applied apparatus, and irradiation methodENYAMA MOMOYO·Filed 2011·Granted Dec 9, 2014·3 cites·12 claims
- 0470US8552373B2Charged particle beam device and sample observation methodENYAMA MOMOYO·Filed 2010·Granted Oct 8, 2013·2 cites·20 claims
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