Assignee
ERSUE ENIS
DE·2 granted patents·1 pending application·66 citations·filing 2005–2006
Top patents by PatentIndex Score
3 records- 0191US8520067B2Method for calibrating a measuring systemERSUE ENIS·Filed 2006·Granted Aug 27, 2013·54 cites·7 claims
- 0276US8059151B2Method for planning an inspection path for determining areas that are to be inspectedERSUE ENIS·Filed 2005·Granted Nov 15, 2011·12 cites·13 claims
- 0331US2009129682A1Method and system for the optical inspection of a periodic structureERSUE ENIS·Filed 2006·Application pending·0 cites
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