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ESPEC CORP
JP47 patents
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USD782511SMar 28, 2017
Display screen with graphical user interface
ESPEC CORP38 citations94
US6955551B2Oct 18, 2005
Card edge connector jig and card edge connector connection mechanism
ESPEC CORP28 citations93
US7115838B2Oct 3, 2006
Unit for varying a temperature of a test piece and testing instrument incorporating same
ESPEC CORP546 citations92
US6938432B2Sep 6, 2005
Cooling apparatus and a thermostat with the apparatus installed therein
ESPEC CORP22 citations89
US7324746B2Jan 29, 2008
Fluid heater and evaluation equipment incorporating the same
ESPEC CORP26 citations88
USD777753SJan 31, 2017
Display screen with graphical user interface
ESPEC CORP10 citations84
USD742332SNov 3, 2015
Control panel
ESPEC CORP11 citations84
USD734181SJul 14, 2015
Temperature and humidity chamber
ESPEC CORP8 citations84
US7558064B2Jul 7, 2009
Cooling apparatus
ESPEC CORP9 citations82
US7257956B2Aug 21, 2007
Cooling apparatus
ESPEC CORP14 citations82
US8359906B2Jan 29, 2013
Environment testing apparatus capable of controlling condensation amount, and control method therefor
ESPEC CORP12 citations80
US7216044B2May 8, 2007
Battery state diagnosing device and battery state diagnosing method
ESPEC CORP14 citations75
US7359808B2Apr 15, 2008
Fuel cell evaluation method and fuel cell evaluation apparatus
ESPEC CORP6 citations74
US9551646B2Jan 24, 2017
Apparatus for environmental test
ESPEC CORP2 citations69
US10620113B2Apr 14, 2020
Environmental test apparatus
ESPEC CORP3 citations65
US12222278B2Feb 11, 2025
Environmental testing device with enhanced electromagnetic effect
ESPEC CORP0 citations62
USD883514SMay 5, 2020
Stress test chamber
ESPEC CORP1 citations62
USD882821SApr 28, 2020
Door for stress test chamber
ESPEC CORP1 citations62
US10481078B2Nov 19, 2019
Hygrometer and temperature-humidity chamber provided with same
ESPEC CORP1 citations62
US8348500B2Jan 8, 2013
Hygrometer and dew-point instrument
ESPEC CORP3 citations59
US7415836B2Aug 26, 2008
Cooling apparatus and a thermostat with the apparatus installed therein
ESPEC CORP3 citations59
US7140260B2Nov 28, 2006
Gas flow measuring device and gas flow measuring method
ESPEC CORP4 citations59
US9329118B2May 3, 2016
Environmental chamber
ESPEC CORP2 citations58
US7396606B2Jul 8, 2008
Fuel-cell evaluation equipment
ESPEC CORP2 citations58
US7199598B2Apr 3, 2007
Burn-in substrate for semiconductor devices
ESPEC CORP3 citations54
US12442753B2Oct 14, 2025
Environment forming device
ESPEC CORP0 citations52
US7311528B2Dec 25, 2007
IC socket
ESPEC CORP2 citations52
USD705676SMay 27, 2014
Constant temperature chamber
ESPEC CORP0 citations51
USD705096SMay 20, 2014
Constant temperature chamber
ESPEC CORP0 citations51
USD705097SMay 20, 2014
Constant temperature chamber
ESPEC CORP0 citations51
US7498830B2Mar 3, 2009
Burn-in apparatus
ESPEC CORP1 citations51
US6798222B2Sep 28, 2004
Migration measuring method and measuring apparatus
ESPEC CORP5 citations51
US10012400B2Jul 3, 2018
Humidity control apparatus, environment test apparatus, and temperature and humidity control apparatus
ESPEC CORP1 citations49
US9885485B2Feb 6, 2018
Humidity control apparatus, environment test apparatus, and temperature and humidity control apparatus
ESPEC CORP0 citations49
US9778216B2Oct 3, 2017
Hygrometer and dew-point instrument
ESPEC CORP0 citations49
US12159979B2Dec 3, 2024
Test jig, test device, and test method for secondary battery
ESPEC CORP0 citations48
US8342046B2Jan 1, 2013
Environmental test apparatus
ESPEC CORP1 citations46
US7497136B2Mar 3, 2009
Environmental test apparatus
ESPEC CORP1 citations46
US12331980B2Jun 17, 2025
Snow making apparatus and environment forming apparatus
ESPEC CORP0 citations42
US12287137B2Apr 29, 2025
Snow making apparatus
ESPEC CORP0 citations42
US10852348B2Dec 1, 2020
Contact-type testing device and environmental test method
ESPEC CORP0 citations42
US7043151B2May 9, 2006
Pipe heater manufacturing method and pipe heater
ESPEC CORP0 citations42
US7312522B2Dec 25, 2007
Mounting member of semiconductor device, mounting configuration of semiconductor device, and drive unit of semiconductor device
ESPEC CORP0 citations40
US6767221B2Jul 27, 2004
IC socket module
ESPEC CORP0 citations39
US9453872B2Sep 27, 2016
Apparatus and method for power cycle test
ESPEC CORP1 citations36
US7214961B2May 8, 2007
Semiconductor testing device and semiconductor testing method
ESPEC CORP0 citations35
US11762003B2Sep 19, 2023
Environment forming apparatus, program, and method for controlling blower fan
ESPEC CORP0 citations31