Assignee
EZUMI MAKOTO
JP·2 granted patents·3 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0178US8481934B2Method for inspecting and measuring sample and scanning electron microscopeEZUMI MAKOTO·Filed 2011·Granted Jul 9, 2013·3 cites·8 claims
- 0250US8835844B2Sample electrification measurement method and charged particle beam apparatusEZUMI MAKOTO·Filed 2010·Granted Sep 16, 2014·0 cites·12 claims
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