Assignee
FENG YE
US5 patents
Top patents by PatentIndex Score
US8062910B1Nov 22, 2011
Measurement of a sample using multiple models
FENG YE7 citations82
US8068228B2Nov 29, 2011
In-plane optical metrology
FENG YE5 citations73
US8462345B2Jun 11, 2013
In-plane optical metrology
FENG YE3 citations62
US8501501B1Aug 6, 2013
Measurement of a sample using multiple models
FENG YE2 citations61
US8252608B1Aug 28, 2012
Measurement of a sample using multiple models
FENG YE1 citations61