Assignee
FENG YIQI
0 granted patents·2 pending applications·0 citations·filing 2006–2007
Top patents by PatentIndex Score
2 records- 0138US2008182132A1Determining the cleanliness of a part used in manufacturing by selectively detecting particles substantially comprised of hard contaminantFENG YIQI·Filed 2007·Application pending·0 cites
- 0234US2008148553A1Extracting particles from a slider to enable particle quantificationFENG YIQI·Filed 2006·Application pending·0 cites
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