Assignee
FFI CORP
US·10 granted patents·105 citations·filing 1995–2000
Technology mixF26B10
Top patents by PatentIndex Score
10 records- 0177US6233843B1Wiper for a floor sweep assembly of a grain dryer associated methodFFI CORP·Filed 2000·Granted May 22, 2001·16 cites·9 claims
- 0269US5570521AControl system for a grain dryer and probe mounting apparatus thereforFFI CORP·Filed 1995·Granted Nov 5, 1996·21 cites·8 claims
- 0362US6076276AFloor sweep assembly for a grain dryer having primary support members and ancillary support members which form a number of intersections with a wiperFFI CORP·Filed 1998·Granted Jun 20, 2000·17 cites·20 claims
- 0456US6073364AWiper for a floor sweep assembly of a grain dryer which includes ultra-high molecular weight resin which contacts grain and grain shelf floor during rotation thereofFFI CORP·Filed 1998·Granted Jun 13, 2000·12 cites·4 claims
- 0555US6098305AGrain metering system for a grain dryer which includes a pivotable grain support member positioned between a metering roll and a discharge opening of a grain columnFFI CORP·Filed 1998·Granted Aug 8, 2000·14 cites·28 claims
- 0653US6073367AFloor sweep assembly for a grain dryer having support members and wipers which are spaced apart from each other by spacing members at intersections formed therebetweenFFI CORP·Filed 1998·Granted Jun 13, 2000·12 cites·25 claims
- 0738US6189235B1Grain flow regulator for a grain dryerFFI CORP·Filed 2000·Granted Feb 20, 2001·0 cites·18 claims
- 0837US6101742AApparatus and method for metering grain in a grain dryer which utilizes a grain flow regulatorFFI CORP·Filed 1998·Granted Aug 15, 2000·5 cites·8 claims
- 0934US6088929AGrain metering system for a grain dryer having improved grain column discharge opening and metering roll configurationFFI CORP·Filed 1998·Granted Jul 18, 2000·5 cites·19 claims
- 1029US6141886AGrain metering system for a grain dryer having improved grain flow angle configuration at grain column discharge openingFFI CORP·Filed 1998·Granted Nov 7, 2000·3 cites·26 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →