Assignee
FIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY
CN·1 granted patent·1 pending application·4 citations·filing 2013–2013
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2 records- 0169US9329228B2Prognostic circuit of electromigration failure for integrated circuitFIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY·Filed 2013·Granted May 3, 2016·4 cites·9 claims
- 0241US2015168271A1Method and system for performing components fault problem close loop analysisFIFTH ELECTRONICS RES INST OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY·Filed 2013·Application pending·0 cites
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