Assignee
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH
CN·7 granted patents·10 citations·filing 2013–2018
Top patents by PatentIndex Score
7 records- 0184US10191480B2Method and system of close-loop analysis to electronic component fault problemFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2018·Granted Jan 29, 2019·5 cites·4 claims
- 0276US10732216B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2018·Granted Aug 4, 2020·2 cites·4 claims
- 0371US9952275B2Method and device of remaining life prediction for electromigration failureFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2013·Granted Apr 24, 2018·3 cites·3 claims
- 0437US11231702B2Method, device and system for health monitoring of system-on-chipFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Jan 25, 2022·0 cites·8 claims
- 0534US10598713B2ESD failure early warning circuit for integrated circuitFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Mar 24, 2020·0 cites·11 claims
- 0633US10458823B2System and method for health monitoring and early warning for electronic deviceFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Oct 29, 2019·0 cites·8 claims
- 0731US10503578B2On-chip TDDB degradation monitoring and failure early warning circuit for SoCFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Dec 10, 2019·0 cites·10 claims
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