Assignee
FITZ CLEMENS
DE·2 granted patents·2 pending applications·0 citations·filing 2007–2012
Top patents by PatentIndex Score
4 records- 0139US8765586B2Methods of forming metal silicide regions on semiconductor devicesFITZ CLEMENS·Filed 2011·Granted Jul 1, 2014·0 cites·19 claims
- 0234US8835318B2HNO3 single wafer clean process to strip nickel and for MOL post etchFITZ CLEMENS·Filed 2012·Granted Sep 16, 2014·0 cites·12 claims
- 0332US2008124920A1Fabrication method for an integrated circuit structureFITZ CLEMENS·Filed 2007·Application pending·0 cites
- 0429US2013049124A1Mosfet integrated circuit with improved silicide thickness uniformity and methods for its manufactureFITZ CLEMENS·Filed 2011·Application pending·0 cites
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