Assignee
FORLENZA DONATO ORAZIO
US·2 granted patents·13 citations·filing 2008–2008
Technology mixG01R2
Top patents by PatentIndex Score
2 records- 0182US8086924B2Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patternsFORLENZA DONATO ORAZIO·Filed 2008·Granted Dec 27, 2011·13 cites·20 claims
- 0239US8065575B2Implementing isolation of VLSI scan chain using ABIST test patternsFORLENZA DONATO ORAZIO·Filed 2008·Granted Nov 22, 2011·0 cites·20 claims
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