Assignee
FORMFACTOR INC
US455 patents
Top patents by PatentIndex Score
US7928750B2Apr 19, 2011
Contactless interfacing of test signals with a device under test
FORMFACTOR INC133 citations99
US7002363B2Feb 21, 2006
Method and system for compensating thermally induced motion of probe cards
FORMFACTOR INC187 citations99
US6913468B2Jul 5, 2005
Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods
FORMFACTOR INC154 citations99
US6910268B2Jun 28, 2005
Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via
FORMFACTOR INC175 citations99
US6891385B2May 10, 2005
Probe card cooling assembly with direct cooling of active electronic components
FORMFACTOR INC126 citations99
US6888362B2May 3, 2005
Test head assembly for electronic components with plurality of contoured microelectronic spring contacts
FORMFACTOR INC145 citations99
US6882239B2Apr 19, 2005
Electromagnetically coupled interconnect system
FORMFACTOR INC120 citations99
US6845491B2Jan 18, 2005
Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes
FORMFACTOR INC131 citations99
US6836962B2Jan 4, 2005
Method and apparatus for shaping spring elements
FORMFACTOR INC148 citations99
US6835898B2Dec 28, 2004
Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures
FORMFACTOR INC174 citations99
US6827584B2Dec 7, 2004
Interconnect for microelectronic structures with enhanced spring characteristics
FORMFACTOR INC145 citations99
US6825052B2Nov 30, 2004
Test assembly including a test die for testing a semiconductor product die
FORMFACTOR INC114 citations99
US6818840B2Nov 16, 2004
Method for manufacturing raised electrical contact pattern of controlled geometry
FORMFACTOR INC74 citations99
US6817052B2Nov 16, 2004
Apparatuses and methods for cleaning test probes
FORMFACTOR INC150 citations99
US6816031B1Nov 9, 2004
Adjustable delay transmission line
FORMFACTOR INC115 citations99
US6811406B2Nov 2, 2004
Microelectronic spring with additional protruding member
FORMFACTOR INC270 citations99
US6807734B2Oct 26, 2004
Microelectronic contact structures, and methods of making same
FORMFACTOR INC115 citations99
US6791176B2Sep 14, 2004
Lithographic contact elements
FORMFACTOR INC105 citations99
US6788094B2Sep 7, 2004
Wafer-level burn-in and test
FORMFACTOR INC95 citations99
US6778406B2Aug 17, 2004
Resilient contact structures for interconnecting electronic devices
FORMFACTOR INC247 citations99
US6741085B1May 25, 2004
Contact carriers (tiles) for populating larger substrates with spring contacts
FORMFACTOR INC175 citations99
US6729019B2May 4, 2004
Method of manufacturing a probe card
FORMFACTOR INC185 citations99
US6727579B1Apr 27, 2004
Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures
FORMFACTOR INC203 citations99
US6705876B2Mar 16, 2004
Electrical interconnect assemblies and methods
FORMFACTOR INC105 citations99
US6701612B2Mar 9, 2004
Method and apparatus for shaping spring elements
FORMFACTOR INC135 citations99
US6690185B1Feb 10, 2004
Large contactor with multiple, aligned contactor units
FORMFACTOR INC268 citations99
US6686754B2Feb 3, 2004
Integrated circuit tester with high bandwidth probe assembly
FORMFACTOR INC114 citations99
US6680659B2Jan 20, 2004
Integrated circuit interconnect system
FORMFACTOR INC130 citations99
US6678850B2Jan 13, 2004
Distributed interface for parallel testing of multiple devices using a single tester channel
FORMFACTOR INC135 citations99
US6672875B1Jan 6, 2004
Spring interconnect structures
FORMFACTOR INC249 citations99
US6655023B1Dec 2, 2003
Method and apparatus for burning-in semiconductor devices in wafer form
FORMFACTOR INC116 citations99
US6657455B2Dec 2, 2003
Predictive, adaptive power supply for an integrated circuit under test
FORMFACTOR INC114 citations99
US6640432B1Nov 4, 2003
Method of fabricating shaped springs
FORMFACTOR INC138 citations99
US6624648B2Sep 23, 2003
Probe card assembly
FORMFACTOR INC176 citations99
US6622103B1Sep 16, 2003
System for calibrating timing of an integrated circuit wafer tester
FORMFACTOR INC134 citations99
US6621260B2Sep 16, 2003
Special contact points for accessing internal circuitry of an integrated circuit
FORMFACTOR INC98 citations99
US6616966B2Sep 9, 2003
Method of making lithographic contact springs
FORMFACTOR INC179 citations99
US6597187B2Jul 22, 2003
Special contact points for accessing internal circuitry of an integrated circuit
FORMFACTOR INC99 citations99
US6551844B1Apr 22, 2003
Test assembly including a test die for testing a semiconductor product die
FORMFACTOR INC109 citations99
US6538214B2Mar 25, 2003
Method for manufacturing raised electrical contact pattern of controlled geometry
FORMFACTOR INC114 citations99
US6539531B2Mar 25, 2003
Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes
FORMFACTOR INC206 citations99
US6534856B1Mar 18, 2003
Sockets for “springed” semiconductor devices
FORMFACTOR INC138 citations99
US6525555B1Feb 25, 2003
Wafer-level burn-in and test
FORMFACTOR INC164 citations99
US6520778B1Feb 18, 2003
Microelectronic contact structures, and methods of making same
FORMFACTOR INC328 citations99
US6509751B1Jan 21, 2003
Planarizer for a semiconductor contactor
FORMFACTOR INC314 citations99
US6501343B2Dec 31, 2002
Integrated circuit tester with high bandwidth probe assembly
FORMFACTOR INC125 citations99
US6499121B1Dec 24, 2002
Distributed interface for parallel testing of multiple devices using a single tester channel
FORMFACTOR INC161 citations99
US6491968B1Dec 10, 2002
Methods for making spring interconnect structures
FORMFACTOR INC178 citations99
US6482013B2Nov 19, 2002
Microelectronic spring contact element and electronic component having a plurality of spring contact elements
FORMFACTOR INC272 citations99
US6483328B1Nov 19, 2002
Probe card for probing wafers with raised contact elements
FORMFACTOR INC149 citations99
Showing the top 50 of 455 patents by PatentIndex Score.